Name
STAr Technologies, Inc.
Description
STAr delivers innovative probe card solutions for the most demanding semiconductor testing applications. We excel in SoC IC testing with our Optima MEMS vertical high pin count probe cards (down to 35µm pitch and >2A currents across tri-temperature).
STAr’s one-touch 3D MEMS probe cards significantly lower the Cost-of-Test for Flash memory ICs with single-card tri-temperature testing. For CMOS image sensors (CIS), we offer 3D MEMS probe cards supporting >3.5GSPS C-PHY tests, with next-gen 6GSPS in development.
STAr also introduced Zeus Membrane Probe Cards for signal-critical RF applications, featuring tunable components, adjustable contact force, high channel density, and versatile RF connectors. Additionally, our MEMS WAT probe cards support femto-ampere low-leakage current WAT tests with 35µm pitch capability.
STAr is dedicated to providing our customers with the most advanced and reliable probe card solutions.
STAr’s one-touch 3D MEMS probe cards significantly lower the Cost-of-Test for Flash memory ICs with single-card tri-temperature testing. For CMOS image sensors (CIS), we offer 3D MEMS probe cards supporting >3.5GSPS C-PHY tests, with next-gen 6GSPS in development.
STAr also introduced Zeus Membrane Probe Cards for signal-critical RF applications, featuring tunable components, adjustable contact force, high channel density, and versatile RF connectors. Additionally, our MEMS WAT probe cards support femto-ampere low-leakage current WAT tests with 35µm pitch capability.
STAr is dedicated to providing our customers with the most advanced and reliable probe card solutions.
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