. Probe Cards for HV/HC power device test (Si, SiC, GaN)
. Known Good Die Test (KGD) for power device (Si, SiC: IGBT, MOSFET, Diode…)
. Probe Cards for Sensors (MEMS, pressure, magnetic, gas, radiation…)
. Vertical Probe Cards for Automotive ASICS, RADAR
. Docking solutions for High Power probe cards (probe card, signal tower, load board suitable for automatic probe card changer)